RF&Testing
Chip Testing Module
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Chip Testing Module
Description

Function test or aging test of chips or integrated circuit products under 85% humidity and 85°C temperature.

Feature

1. Suitable for connector DUT less than or equal to 0.3mm Picth

2. Meet the requirements of 5*20=100DUT parallel test

3. PCB connector plug-in transmission makes the test communication more stable

Specification

1. Module Size: 90*136*29mm

2. Material -> DUT: PEEK

3. Connection : POGO pin

4. Lifetime: 100K

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